In this study, a new nondestructive technique for passport examination is proposed. In this technique, linearly polarized light is used to measure Fourier transform infrared (FT-IR) reflectance spectra of films on the biographical data page. Thirty genuine and thirty-five counterfeit Japanese passports and five marketed films pasted on name cards were examined. The measured spectra were analyzed as follows. The absorption spectra were obtained by the Kramers-Kronig transformations of reflectance spectra. The peak ratios were then calculated from the absorption spectra by adding the peak areas at 1126 and 1263 cm(-1) and dividing the result by the peak area at 1727 cm(-1). When nonpolarized light was used, the samples could not be distinguished by comparing the peak ratios. However, when polarized light was used, they were successfully distinguished by the comparison. Therefore, polarized light is useful for the forensic discrimination of passport films by the measurement of FT-IR spectra.

译文

:在这项研究中,提出了一种新的护照无损检测技术。在此技术中,线偏振光用于测量传记数据页面上胶片的傅立叶变换红外(FT-IR)反射光谱。检查了三十三本伪造的日本护照和三十五本伪造的日本护照,以及五张贴在名片上的市售影片。所测量的光谱如下分析。通过反射光谱的Kramers-Kronig变换获得吸收光谱。然后,通过将1126和1263 cm(-1)处的峰面积相加并将结果除以1727 cm(-1)处的峰面积,从吸收光谱中计算出峰比。使用非偏振光时,无法通过比较峰比率来区分样品。然而,当使用偏振光时,通过比较成功地将它们区分开。因此,偏振光可用于通过FT-IR光谱的测量来鉴别护照薄膜。

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